An international research team has developed a novel PV fault detection method based on deep learning of aerial images. The proposed methodology utilizes the convolutional neural network (CNN) ...
In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Background Although chest X-rays (CXRs) are widely used, diagnosing mitral stenosis (MS) based solely on CXR findings remains ...
CHICAGO--(BUSINESS WIRE)--GE HealthCare (Nasdaq: GEHC) unveiled three new advanced deep learning image processing and reconstruction solutions as a part of its Effortless Recon DL portfolio at the ...